Industrial Equipment Monitoring Dataset for Predictive Maintenance Analysis

Authors

  • Kreshna Lucky Pradana Program studi Teknik mekatronika, Jurusan Teknik Elektro, Politeknik Negeri Batam Author
  • Adlian Jefiza Politeknik Negeri Batam Author

DOI:

https://doi.org/10.60036/t9mr4w17

Keywords:

Support Vector Machine (SVM), , Klasifikasi,, Deteksi Faulty, Data Sensor, Ketidakseimbangan Kelas

Abstract

This study develops and evaluates a Support Vector Machine (SVM) model using a Radial Basis Function (RBF) kernel to detect faulty conditions in systems based on sensor data (temperature, pressure, vibration, humidity). The data is processed through normalization and split into training and testing sets. The evaluation results show an overall model accuracy of 0.93. The model is highly effective in identifying normal conditions (precision 0.93, recall 1.00), but less optimal in detecting faulty conditions (precision 0.96, recall 0.30), indicating a high number of false negatives and a low F1-score (0.45) for this class. The ROC AUC score of 0.892 indicates good overall discriminative ability. This performance gap is likely due to class imbalance. Enhancing faulty detection through class imbalance handling or further model optimization is recommended for critical applications.

References

[1] Gupta, R., Jain, K., & Jain, R. (2020). Predictive Maintenance using Machine Learning: A Case Study of Industrial Equipment. Procedia Computer Science, 167, 2621–2630.

[2] Javed, K., Gouriveau, R., & Zerhouni, N. (2021). A comprehensive review on data-driven predictive maintenance approaches using deep learning. IEEE Transactions on Industrial Informatics, 17(3), 2206-2225.

[3] Rahman, A., Ismail, M., & Zaini, N. (2022). Integrating Predictive Maintenance in Technical Education Using Smart Datasets. International Journal of Evaluation and Research in Education (IJERE), 11(2), 507-514

[4] Assagaf, A. Sukandi, A. A. Abdillah, S. Arifin, and J. L. Ga, “Machine Predictive Maintenance by Using Support Vector Machines”, RiESTech, vol. 1, no. 01, pp. 31–35, Jan. 2023

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Published

2025-12-29